ith the increase in system-level tools for field-programmable gate arrays (FPGAs) over the last few years, an increasing number of manufacturers are including FPGAs in instrumentation. What’s more, engineers are given the choice to reprogram these FPGAs according to their requirements. So test engineers can embed a custom algorithm into the device to perform in-line processing inside the FPGA, or even emulate part of the system that requires a real-time response.
Satish Thakare, head-R&D, VLSI division, Scientech Technologies, explains the traditional challenges that led to this trend: “Designers and manufacturers have to face a lot of challenges to make the product available in the market in a short time. Using a hardware-based approach does not serve the purpose as the designer has to redesign the hardware for every product. Even conventional methods will not serve the purpose as it works on the sequential method. So the designers need a kind of technology that allows them to change the functionality without changing the hardware while being able to upgrade the product on the go.”
Thakare goes on to explain the solution: “The obvious choice for the de - the FPGA in the instruments is that it offers high reliability, low latency, embedded digital signal processor (DSP) core and true parallelism.”