An ex­am­ple: Test­ing smart­phones

Electronics For You - - TEST & MEASUREMENT -

As­sume that you are test­ing smart­phones and run­ning three dif­fer­ent tests on each: a power con­sump­tion test that uses a pro­gram­mable source mea­sure unit (SMU), a GSM test that uses an RF vec­tor sig­nal gen­er­a­tor (VSG) and an au­dio qual­ity test that uses a dy­namic sig­nal anal­yser (DSA). As­sume that each of th­ese tests takes one unit of time to ex­e­cute. On a typ­i­cal test sys­tem that tests one phone at a time se­quen­tially, you would test th­ese phones at a rate of one de­vice un­der test (DUT) ev­ery three units of time. Test­ing three phones would take nine (3×3 = 9) units of time.

The se­quen­tial test ex­am­ple in Fig. 2 shows that each test in­stru­ment is left un­used for six of nine time units. That’s a 66 per cent down­time per in­stru­ment! Imag­ine how much more ef­fi­cient your test sys­tem could be if you use this down­time to start test­ing the next phone. This is pre­cisely what you can do with par­al­lel test­ing.

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