IIT Delhi, Japan varsity in tie up for scientific analysis

NEW DELHI: Researchers at Institute of Information Technology (IIT), Delhi, in a cross-country scientific collaboration, did a sample analysis of the composition of a multi-layered thin filmed sample using a high tech machine at Bi o-Na no Electronic Research Center (BNERC), Toyo University, Kawagoe, Japan.

This collaboration, believed to bring about changes in the research ecosystem, would help to increase the understanding of material science.

Scientists at the BNERC put sample of Ms. Khushboo Agarw al, are search scholar in Physics at Nano Research Facility at IIT Delhi, into the Hard X-ray Photoelectron Spectroscopy (HAXPES).

Agarwal fed the parameters into her own system and got the composition of her sample at a depth which can not be observed in the normal machines. She further did the analysis and delineated the element al bonding of the sample.

“This is a great feeling. This analysis is multi-layered and goes down to a depth of 40 nanometer. It is an ongoing process and we will soon be analyzing more samples using this machine,” Agarwal said with excitement.

This advanced X-ray power, can help one get the core-shell structure of the nano-particles and obtain the data from deep inside the materials.